It has been over 30 years since the first focused ion beam was used to make a TEM specimen. FEI, a company that is now part of Thermo Fisher Scientific, has been an essential part of helping take ion ...

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...

Researchers at the University of Sydney have developed a sunlight-powered method to produce clean ...

French scientists have studied the fabrication of silicon heterojunction cells with p-type wafers. With the adoption of gallium doping, the p-type products could come close to matching the performance ...