About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

Test compression has quickly moved from a luxury item for leading edge companies to a necessity for much of the mainstream market. This is because semiconductor companies manufacturing designs at ...

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...