A new electron spin resonance-atomic force microscopy setup enables single-spin quantum control on nonconductive samples.

Force microscopy is a family of scanning probe microscopy techniques that enable the visualization and manipulation of materials at the nanoscale. These techniques rely on the interaction forces ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

Atomic force microscopy (AFM) has emerged as an indispensable technique for probing the mechanical and structural properties of living cells at nanometre resolution. By employing a sharp probe to ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

AFAM operates by exciting the sample with ultrasonic waves while simultaneously probing the surface with an AFM tip. The ultrasonic waves cause the sample to vibrate, and the AFM tip detects these ...

Invented in 1986 atomic force microscopy (AFM) has become a valuable tool for life scientists, offering the ability to image aqueous biological samples, like membranes, at nanometer resolution. The ...

Why do certain surfaces behave very differently from what theoretical calculations suggest? Scientists long assumed that the ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...